1978
|
Hünfeld
(Germany)
|
Dislocations
in Tetrahedrally Coordinated Semiconductors
(Inauguration conference - "EDS 1")
H. Alexander (Köln), P. Haasen (Göttingen), R. Labusch (Clausthal), W.
Schröter (Göttingen)
|
1980
|
Krynica
(Poland)
|
Defect induced phenomena in Semiconductors
("EDS 2")
J. Auleytner (Warszawa)
|
1983
|
Aussois
(France)
|
Properties
and Structure of Dislocations in Semiconductors
("EDS 3")
J. Philibert, B. Sieber, A. Zozime (Meudon-Bellevue)
|
1986
|
Zvenigorod
(USSR)
|
Structure
and Properties of Dislocations in Semiconductors
("EDS 4")
Yu. A. Osip'yan (Chernogolovka)
|
1988
|
Szczyrk
(Poland)
|
Defects
in Crystals
("EDS 5")
J. Auleytner, T. Figielski, E. Kaczmarek, E. Mizera, T.Wosinski (Warszawa)
|
1989
|
Oxford
(UK)
|
Structure
and Properties of Dislocations in Semiconductors
("EDS 6")
P. B. Hirsch, G. R. Booker, D. B. Holt, J. L. Hutchison, S. G. Roberts, P. R.
Wilshaw (Oxford)
|
1992
|
Holzhau
(Germany)
|
Structure
and Properties of Extended Defects in Semiconductors
(EDS 7)
P. Haasen
(Göttingen), H. Alexander (Köln), J. Auleytner (Warszawa), J. Heydenreich
(Halle), W. Schröter (Göttingen)
|
1996
|
Giens
(France)
|
Extended
Defects in Semiconductors
(EDS 8)
B. Pichaud (Marseille), S. Pizzini (Milano), A. Cavallini (Bologna), G.
Vanderschaeve (Toulouse)
|
1998
|
Jaszowiec
(Poland)
|
Extended
Defects in Semiconductors
(EDS 9)
T. Figielski (Warszawa), W. Schroeter (Goettingen)
|
2000
|
Brighton
(UK)
|
Extended
Defects in Semiconductors
(EDS 10)
M. Heggie (Brighton)
|
2002
|
Bologna
(Italy)
|
Extended
Defects in Semiconductors
(EDS 11)
A. Cavallini (Bologna), V. V. Kveder (Chernogolovka), S. Pizzini (Milano)
|
2004
|
Chernogolovka
(Russia)
|
Extended Defects in
Semiconductors
(EDS 12)
Yu. A. Osip'yan, V. V. Kveder (Chernogolovka)
|
2006
|
Halle
(Germany)
|
Extended Defects in
Semiconductors
(EDS 13)
H. S. Leipner (Halle), M. Kittler (Frankfurt/Oder)
|
2008
|
Poitiers
(France)
|
Extended Defects in
Semiconductors
(EDS 14)
J. Rabier (Poitiers), E. Le Bourhis (Poitiers)
|
2010
|
Brighton
(UK)
|
Extended Defects in Semiconductors
(EDS 15)
M. Heggie (Brighton), M. Skowronski (Pittsburgh)
|