International Conference on Extended Defects in Semiconductors
June 24-29, 2012, Thessaloniki, Greece |
International Advisory Committee
- Tonio Buonassisi, MIT, USA
- Anna Cavallini, University of Bologna, Italy
- Cor Claeys, IMEC, Leuven, Belgium
- Malcolm I. Heggie, University of Sussex, Brighton, UK
- Robert Hull, University of Virginia, Charlottesville, USA
- Robert Jones, University of Exeter, UK
- Martin Kittler, IHP Frankfurt (Oder) and IHP/BTU Joint Lab Cottbus,
Germany
- Philomela Komninou, AUTH, Greece
- Vitaly V. Kveder, ISSP RAS, Chernogolovka, Russia
- Marc Legros, CEMES, Toulouse, France
- Hartmut Leipner, University of Halle, Germany
- Bernard Pichaud, Université Aix-Marseille III, Marseille, France
- Pirouz Pirouz, Case Western Reserve University, Cleveland, USA
- Jacques Rabier, Université de Poitiers, France
- Michael Seibt, Georg-August Universität Göttingen, Germany
- Marek Skowronski, Carnegie-Mellon University, Pittsburgh, USA
- Horst P. Strunk, University of Stuttgart, Germany
- Eicke Weber, Fraunhofer Institute, Freiburg, Germany
- Tadeusz Wosinski, Institute of Physics PAS, Warsaw, Poland
- Ichiro Yonenaga, Institute of Materials Research, Tohoku University, Japan
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